Wahyudin Permana Syam

Research Summary

Wahyudin Syam received his PhD from Politecnico di Milano, Milan, Italy. His main researches are metrology and additive manufacturing. For metrology, main focuses are measurement of form and surface texture of manufactured part. Related topics to metrology are calibration method, performance verification method (ISO 10360 series), measurement uncertainty (GUM, ISO 15530 series), algorithm for geometric fitting, algorithm for automatic tool inspection, computer vision and precision design. Calibration, performance verification and measurement uncertainty are fundamental principle and central aspect in metrology especially to assure traceability problem. The most important applicability of metrology is in quality inspection in manufacturing process.

Main topics for research related to additive manufacturing are design too to support design for additive manufacturing, e.g. early accuracy prediction of additive manufacturing part, functionality-based part orientation for assembly product made by additive manufacturing. In addition, lattice structure made by additive manufacturing for metrology frame is currently under development. Current active researches are development of new optical micro coordinate measuring machine (CMM) based on information-rich metrology (IRM) principle. He is familiar with various metrology instruments such as focus-variation, white light interferometry, point autofocus, contact CMM. Among various software heavily used in his research is computer-aided design (CAD) software, computer aided manufacturing (CAM), C/C++, MATLAB and other C/C++ libraries. Regarding additive manufacturing machines, he is familiar with fused-deposition modeling (FDM) and electron beam melting (EBM) as well as support for these processes, e.g. magic software.

During his research, he involved in various industrial projects. To mention some of them are Speroni (tool presetter producer), Xaar (Inkjet print head producer), Markem Image (industrial label printing), Alicona (optical metrology manufacturer), etc.

Potential collaboration

There are many potential topics for collaboration and development. One of main potential topic is to develop in-line metrology (for geometry and surface texture measurement) for quality assurance in manufacturing industries. Currently, one of European main research topic in metrology is for in-line inspection (see figure 1). Common method for in-line metrology nowadays is still not yet fully effective to detect defect on manufacture product. There are two main challenges for inline metrology solution: short measurement time (at least less than the manufacturing process) and fluctuated environment condition (temperature, vibration, etc). Off-line solution metrology (taking part out of manufacturing process and bring it to specific place for specific measurement) has grown very much in term of new various methods can measure what previously cannot be measured as well as increase in resolution to inspect smaller and smaller part. But, this offline solution will be the barrier for production efficiency since the part should be taken away from the manufacturing process. Moreover, offline inspection significantly takes times as such it prolong deliverable time of a product and for sure there are cost for this long deliverable time. On the other hand, the only solution for this production efficiency problem is inline measurement where the metrology instruments are integrated into manufacturing process, e.g. into a specific machine or inline quality inspection posy inside the manufacturing process. Currently, the inline metrology solution still not fully effective for examples: the inline inspection time is still longer than the manufacturing process time, is having limited detectable features can be measured by inline metrology instrument, is still require a lot of operator intervention, and is very expensive solution.

Figure 1. Example of the use of inline metrology instrument.

For this reason, there is a big opportunity to develop inline metrology solution that can at least overcome some of the drawback of current inline metrology. Improvement in computer vision technique can be a potential research collaboration that can be focused on. Some topics regarding this inline metrology are such as development of robust algorithm, development of intelligent sampling, development of good camera system, configuration. Vision-based system is a cost effective solution since camera and computer are available widely with very high performance and reduced cost. With vision-based system, not only 2D measurement can be carried out but also 3D measurement can be carried out by triangulation method and photogrammetry approach. Photogrammetry approach require two or more camera system which are configure in such a way that 3D surface can be reconstructed by triangulation of corresponding points on images fo the two or more cameras. Intelligent sampling to speed up measurement time is very important as well. Intelligent sampling means that how to decide where and how many data need to be sampling such as we can get the most important information but keep the measurement time short (avoiding total sampling which require a lot of time). A lot of method can be the focus for collaboration, involving machine learning approach, statistic, etc. Another possible collaboration is to develop a design method for precision instrument. For precision instrument, special method should be developed since only conventional method to develop normal machine is not sufficient. In precision design every small aspects are taken into account which can contribute to total errors of machines can have.

Another possible collaboration with regard to additive manufacturing is development of software to support design for additive manufacturing (see figure 2). Software development does not require a lot of capital since free library can be used to develop the software, e.g. free library for C/C++ programming: vtk, eigen, pcl, etc.

Figure 2. Developed software by the author using Visual C++ and free 3D visualization library